Quality is Our Cultural Cornerstone
At SEMICORE, quality is not a checkpoint—it is the foundation of trust. Every component carries our commitment to integrity.
7-Stage Verification Protocol
Source Approval
Factory audits and supplier qualification.
Documental Forensics
Verifying OEM certificates and chain-of-custody.
Visual Analysis
Microscopic inspection of markings and dimensions.
Electrical Testing
Parametric and functional validation.
Material Analysis
XRF, C-SAM, and Decapsulation for deep verification.
Data Integration
Digital recording of all test results.
Final Release
QA Manager review and CoC generation.
Advanced Material & Structural Analysis
For high-risk, high-value, or suspicious components, we deploy advanced forensic techniques to ensure absolute authenticity.
X-Ray Fluorescence (XRF)
Verifies elemental composition of lead finishes to ensure compliance and detect lead-free fraud.
Scanning Acoustic Microscopy (C-SAM)
Detects internal package defects like delamination or cracks invisible to the eye.
Decapsulation & Die Analysis
The ultimate verification. We chemically open the package to microscopically inspect the silicon die.
